Surface and Film Analysis for Materials Characterization Labs
Materials Science and Engineering
We are proposing the purchase of a new Surface Profilometer. This instrument will measure thin and thick films from 10 nano meters to 10 centimeters. It can also measure surface roughness on materials that are too rough for Atomic Force Microscopy (AFM). The MSE department had this resource until about 1 year ago when the instrument electronics failed. We will be able to use that instrument as a trade in to reduce the cost of the new one.